• DocumentCode
    2357094
  • Title

    Nanodielectric surface flashover studies under kHZ range pulsed fields in partial vacuum

  • Author

    Li, Fang ; Kirkici, Hulya

  • Author_Institution
    Electr. & Comput. Eng., Auburn Univ. Auburn, Auburn, AL, USA
  • fYear
    2010
  • fDate
    23-27 May 2010
  • Firstpage
    453
  • Lastpage
    456
  • Abstract
    In this paper, we present the experimental results of surface flashover characteristics of nanodielectric filled epoxy resin in partial pressure of nitrogen. Nano-sized Al2O3 and TiO2 powder are used as fillers in epoxy resin with known properties. The surface flashover studies are conducted first under dc applied field and then 20 kHz pulsed unipolar field. The voltage, current, and light emission waveforms during the flashover events are recorded. The optical data is also collected by a video camera. All of the samples are produced in-house and for each sample, two weight ratios, namely 1:50, 1:16.6 (2% and 6%) (powder/epoxy), are cast on Teflon plates. Copper electrodes are mounted over the surface of dielectric samples to initiate surface flashover. The results of surface flashover voltages as a function of pressure are presented. Additionally, optical emission characteristics along with the voltage and current waveform data are also presented.
  • Keywords
    aluminium compounds; flashover; nanoparticles; resins; titanium compounds; Al2O3; Teflon plates; TiO2; copper electrodes; current waveform data; flashover events; frequency 20 kHz; light emission waveforms; nanodielectric filled epoxy resin; nanodielectric surface flashover study; nitrogen partial pressure; optical data; optical emission characteristic; partial vacuum; pulsed unipolar field; video camera; voltage waveform data; Aluminum oxide; Flashover; Optical surface waves; Polymers; Surface treatment; Nano composite dielectrics; Partial pressure nitrogen; Surface flashover;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Modulator and High Voltage Conference (IPMHVC), 2010 IEEE International
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-7131-7
  • Type

    conf

  • DOI
    10.1109/IPMHVC.2010.5958391
  • Filename
    5958391