DocumentCode :
2357195
Title :
Effects of moisture on reliability of gold and copper ball bonds
Author :
Breach, C.D. ; Shen, Ng Hun ; Mun, Tee Wai ; Lee, Teck Kheng ; Holliday, R.
Author_Institution :
ProMat Consultants, Singapore, Singapore
fYear :
2010
fDate :
8-10 Dec. 2010
Firstpage :
44
Lastpage :
51
Abstract :
Gold and copper ball bonds were isothermally aged under moist conditions (85°C and 85% relative humidity (RH)) and wet conditions (85°C in DI water with and without NaCl) in an effort to better understand the corrosion mechanisms that operate under moist and wet conditions. The objective of this work is to undertake and report on the initial stages of a research project that aims to compare the performance and assess the performance limits of gold and copper ball bonds.
Keywords :
bonding processes; copper; electronics packaging; gold; integrated circuit interconnections; moisture; semiconductor device reliability; copper ball bonds; gold ball bonds; moisture effect; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-8560-4
Electronic_ISBN :
978-1-4244-8561-1
Type :
conf
DOI :
10.1109/EPTC.2010.5702603
Filename :
5702603
Link To Document :
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