DocumentCode :
2357539
Title :
Advances in materials for optoelectronic, microelectronic and MOEMS/MEMS packaging
Author :
Zweben, Carl
fYear :
2002
fDate :
12-14 March 2002
Firstpage :
30
Lastpage :
34
Abstract :
Materials selection impacts performance, reliability, weight, manufacturability and cost. A variety of new advanced composite and monolithic materials are now available that provide great advantages over conventional materials for dimensional stability and thermal management in microelectronic, optoelectronic, micro-opto-electromechanical (MOEMS) and micro-electro-mechanical (MEMS) packaging, including: extremely high thermal conductivities; tailorable coefficients of thermal expansion; extremely high strengths and stiffnesses; low densities; and low cost, net shape fabrication processes. Materials with low thermal conductivities and CTEs are also available. The payoffs are: improved fiber alignment; reduced thermal stresses and warpage; lower junction temperatures; simplified thermal design; possible elimination of heat pipes; weight savings up to 80%; size reductions up to 65%; increased reliability; increased manufacturing yield and cost reductions. There are many advanced packaging materials. They fall into five main categories, monolithic carbonaceous materials, metal matrix composites (MMCs), polymer matrix composites (PMCs), carbon/carbon composites (CCCs) and advanced metallic alloys.
Keywords :
fibre reinforced composites; filled polymers; micro-optics; micromechanical devices; reliability; thermal conductivity; thermal expansion; thermal management (packaging); thermal stresses; MEMS; MOEMS; coefficients of thermal expansion; cost; dimensional stability; junction temperatures; manufacturability; metal matrix composites; metallic alloys; microelectronic packaging; monolithic carbonaceous materials; optoelectronic packaging; polymer matrix composites; reliability; shape fabrication; stiffnesses; strengths; thermal conductivities; thermal management; thermal stresses; warpage; weight; Composite materials; Conducting materials; Costs; Manufacturing; Microelectronics; Packaging; Thermal conductivity; Thermal expansion; Thermal management; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
Conference_Location :
San Jose, CA, USA
ISSN :
1065-2221
Print_ISBN :
0-7803-7327-8
Type :
conf
DOI :
10.1109/STHERM.2002.991342
Filename :
991342
Link To Document :
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