DocumentCode
2357590
Title
Thermal performance of flip chip ball grid array packages
Author
Joiner, Bennett ; De Oca, Tony Montes
Author_Institution
Motorola Inc., Austin, TX, USA
fYear
2002
fDate
12-14 March 2002
Firstpage
50
Lastpage
56
Abstract
As processor speeds have increased, flip chip packages are frequently used because of the improved electrical performance than can be achieved with an array of very short, low inductance bumps used for power and ground. Both ceramic (FC-CBGA) and plastic laminate (FC-PBGA) substrates are commonly used for the packages. Historically, the ceramic substrate FC-CBGA packages offer improved electrical performance because of the ability to design with a large number of layers in the packages and small vias permitting effective power and ground planes. Unfortunately, the ceramic substrate packages are perceived to have limited usefulness in applications where solder joint fatigue is considered to be a limiting factor. The plastic laminate FC-PBGA packages have much better solder joint lifetime, but the question of the difference in thermal performance between the two styles of packages must be addressed. This paper compares the thermal performance of 360 ball 25/spl times/25 mm package. The junction to case thermal resistance with the bare die is identical between the two packages; hence, the thermal performance with a heat sink is very similar.
Keywords
ball grid arrays; ceramic packaging; flip-chip devices; inductance; integrated circuit packaging; plastic packaging; thermal management (packaging); thermal resistance; 25 mm; ceramic substrates; flip chip ball grid array packages; heat sink; junction to case thermal resistance; low inductance bumps; plastic laminate substrates; solder joint fatigue; thermal performance; Ceramics; Electronics packaging; Fatigue; Flip chip; Inductance; Laminates; Plastic packaging; Resistance heating; Soldering; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
Conference_Location
San Jose, CA, USA
ISSN
1065-2221
Print_ISBN
0-7803-7327-8
Type
conf
DOI
10.1109/STHERM.2002.991345
Filename
991345
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