• DocumentCode
    2357590
  • Title

    Thermal performance of flip chip ball grid array packages

  • Author

    Joiner, Bennett ; De Oca, Tony Montes

  • Author_Institution
    Motorola Inc., Austin, TX, USA
  • fYear
    2002
  • fDate
    12-14 March 2002
  • Firstpage
    50
  • Lastpage
    56
  • Abstract
    As processor speeds have increased, flip chip packages are frequently used because of the improved electrical performance than can be achieved with an array of very short, low inductance bumps used for power and ground. Both ceramic (FC-CBGA) and plastic laminate (FC-PBGA) substrates are commonly used for the packages. Historically, the ceramic substrate FC-CBGA packages offer improved electrical performance because of the ability to design with a large number of layers in the packages and small vias permitting effective power and ground planes. Unfortunately, the ceramic substrate packages are perceived to have limited usefulness in applications where solder joint fatigue is considered to be a limiting factor. The plastic laminate FC-PBGA packages have much better solder joint lifetime, but the question of the difference in thermal performance between the two styles of packages must be addressed. This paper compares the thermal performance of 360 ball 25/spl times/25 mm package. The junction to case thermal resistance with the bare die is identical between the two packages; hence, the thermal performance with a heat sink is very similar.
  • Keywords
    ball grid arrays; ceramic packaging; flip-chip devices; inductance; integrated circuit packaging; plastic packaging; thermal management (packaging); thermal resistance; 25 mm; ceramic substrates; flip chip ball grid array packages; heat sink; junction to case thermal resistance; low inductance bumps; plastic laminate substrates; solder joint fatigue; thermal performance; Ceramics; Electronics packaging; Fatigue; Flip chip; Inductance; Laminates; Plastic packaging; Resistance heating; Soldering; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-7327-8
  • Type

    conf

  • DOI
    10.1109/STHERM.2002.991345
  • Filename
    991345