• DocumentCode
    2357594
  • Title

    Learning the Relative Importance of Features in Image Data

  • Author

    Varde, Aparna ; Rundensteiner, Elke ; Javidi, Giti ; Sheybani, Ehsan ; Liang, Jianyu

  • Author_Institution
    Virginia State Univ., Petersburg
  • fYear
    2007
  • fDate
    17-20 April 2007
  • Firstpage
    237
  • Lastpage
    244
  • Abstract
    In computational analysis in scientific domains, images are often compared based on their features, e.g., size, depth and other domain-specific aspects. Certain features may be more significant than others while comparing the images and drawing corresponding inferences for specific applications. Though domain experts may have subjective notions of similarity for comparison, they seldom have a distance function that ranks the image features based on their relative importance. We propose a method called features rank for learning such a distance function in order to capture the semantics of the images. We are given training samples with pairs of images and the extent of similarity identified for each pair. Using a guessed initial distance function. Features rank clusters the given images in levels. It then adjusts the distance junction based on the error between the clusters and training samples using heuristics proposed in this paper. The distance junction that gives the lowest error is the output. This contains the features ranked in the order most appropriate the domain. Features rank is evaluated with real image data from nanotechnology and bioinformatics. The results of our evaluation are presented in the paper.
  • Keywords
    image processing; computational analysis; distance function; domain-specific aspects; features rank; image data; Bioinformatics; Computer science; Engineering drawings; Etching; Image analysis; Iterative methods; Mechanical engineering; Nanotechnology; Scanning electron microscopy; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Engineering Workshop, 2007 IEEE 23rd International Conference on
  • Conference_Location
    Istanbul
  • Print_ISBN
    978-1-4244-0832-0
  • Electronic_ISBN
    978-1-4244-0832-0
  • Type

    conf

  • DOI
    10.1109/ICDEW.2007.4400998
  • Filename
    4400998