Title :
A simplified method of generating thermal models for power MOSFETs
Author :
Pandya, Kandarp I. ; McDaniel, Wharton
Author_Institution :
Vishay Siliconix, Santa Clara, CA, USA
Abstract :
There is an increasing need for designers to understand the thermal performance of the semiconductors they use because end-product case sizes are shrinking while product power levels remain the same or increase. A simulation tool such as P-SPICE is the most commonly available tool for engineers to use in performing thermal analysis of semiconductors. However, generating the thermal model for power semiconductors represents a major hurdle in performing such an analysis. A simplified method of model generation is needed. In this paper an Excel spreadsheet uses datasheet information published by the manufacturer to generate the R-C (resistance-capacitance) parameters for a thermal model. Implementation of the model in P-SPICE enables performance evaluation for any pre-defined operating condition. The intent is to arrive at a fair estimate of the junction temperature of the power-handling device, the MOSFET, under transient high-power pulse/s. The explanation of a proposed simplified method of thermal model generation includes an example featuring a power MOSFET.
Keywords :
SPICE; curve fitting; power MOSFET; semiconductor device models; spreadsheet programs; thermal analysis; Excel spreadsheet; P-SPICE simulation tool; end-product case size; junction temperature estimation; manufacturer device datasheet information; power MOSFET thermal analysis; power semiconductor thermal performance evaluation; product power level; resistance-capacitance parameters; simplified thermal modeling; thermal characterization curve; thermal model R-C parameters; transient high-power pulses; Analytical models; MOSFETs; Performance analysis; Power engineering and energy; Power generation; Pulp manufacturing; Semiconductor device manufacture; Thermal engineering; Thermal resistance; Virtual manufacturing;
Conference_Titel :
Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-7327-8
DOI :
10.1109/STHERM.2002.991350