DocumentCode :
2357706
Title :
Detecting spatial outliers with multiple attributes
Author :
Lu, Chang-Tien ; Chen, Dechang ; Kou, Yufeng
Author_Institution :
Dept. of Comput. Sci., Virginia Polytech. Inst. & State Univ., Falls Church, VA, USA
fYear :
2003
fDate :
3-5 Nov. 2003
Firstpage :
122
Lastpage :
128
Abstract :
A spatial outlier is a spatially referenced object whose non-spatial attribute values are significantly different from the values of its neighborhood. Identification of spatial outliers can lead to the discovery of unexpected, interesting, and useful spatial patterns for further analysis. Previous work in spatial outlier detection focuses on detecting spatial outliers with a single attribute. In the paper, we propose two approaches to discover spatial outliers with multiple attributes. We formulate the multi-attribute spatial outlier detection problem in a general way, provide two effective detection algorithms, and analyze their computation complexity. In addition, using a real-world census data, we demonstrate that our approaches can effectively identify local abnormality in large spatial data sets.
Keywords :
computational complexity; data mining; geographic information systems; spatial reasoning; computational complexity; detection algorithm; multiattribute spatial outlier; multiattribute spatial outlier detection problem; nonspatial attribute; spatial data set; spatial data sets; spatial outlier identification; spatial outliers; spatial pattern; spatially reference object; Algorithm design and analysis; Biometrics; Computer science; Credit cards; Detection algorithms; Pattern analysis; Performance analysis; Testing; Voting; Weather forecasting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Tools with Artificial Intelligence, 2003. Proceedings. 15th IEEE International Conference on
ISSN :
1082-3409
Print_ISBN :
0-7695-2038-3
Type :
conf
DOI :
10.1109/TAI.2003.1250179
Filename :
1250179
Link To Document :
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