DocumentCode
2357782
Title
Thermal model requirements for prediction of facet temperature in electro-optical-thermal simulation of ridge lasers
Author
Romo, G. ; Smy, T. ; Walkey, D. ; Reid, B.
Author_Institution
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
fYear
2002
fDate
12-14 March 2002
Firstpage
113
Lastpage
118
Abstract
The nature of heat spreading in ridge laser structures is explored using a new self-consistent electro-optical-thermal simulator with full 3D thermal modeling. The simulator consists of the solutions of the 3D heat equation and the 1D longitudinal carrier and photon rate equations. The simulator is used to investigate facet heating in a ridge laser structure and the results are compared with the predictions of models using lower dimensional thermal equations. The 1D thermal modeling approach used in previously published simulators for these structures are shown to introduce significant errors in heat flow modeling, with a resulting drastic over prediction of facet temperature. The results show that the complexity of heat flow can not properly be described by simple 1D approximations as these lack physical character and are found to compromise accuracy. A 2D approach for modeling facet heating is shown to be a significant improvement over the 1D model. However, its implementation requires a priori non-physical adjustment of material parameters to account for the otherwise three-dimensional heat flow.
Keywords
semiconductor device models; semiconductor device packaging; semiconductor lasers; temperature distribution; 1D longitudinal carrier equations; 3D heat equation; 3D modeling; electro-optical-thermal simulation; facet temperature; heat flow modeling; heat spreading; material parameters; photon rate equations; ridge lasers; semiconductor lasers; thermal model requirements; Equations; Heat sinks; Heating; Laser feedback; Laser modes; Lasers and electrooptics; Optical feedback; Predictive models; Semiconductor lasers; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
Conference_Location
San Jose, CA, USA
ISSN
1065-2221
Print_ISBN
0-7803-7327-8
Type
conf
DOI
10.1109/STHERM.2002.991355
Filename
991355
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