DocumentCode :
2357804
Title :
Cooling of a 32 inch plasma display monitor
Author :
Luiten, G. A Wendy
Author_Institution :
Philips Digital Syst. Lab., Eindhoven, Netherlands
fYear :
2002
fDate :
12-14 March 2002
Firstpage :
119
Lastpage :
124
Abstract :
The development of the cooling design of a 32-inch plasma display monitor for consumer use is described. Two distinct challenges were met. First: abandon the use of fan cooling while coping with a 3-fold energy density increase. Second: meet a strict timing schedule of market introduction. Different thermal design methodologies were used in the different product development phases to meet these challenges, resulting in a successful market introduction and an EISA award for best plasma TV 2001-2002. Cooling the monitor was not a case of identifying and eliminating a single problem cause, but rather an exercise of systematic risk assessment and follow up in the entire development tract. Essential for this complex cooling job were the use of CFD, transferring the geometry directly from the CAD database, careful determination of measurement conditions and a measurement plan, and continuous measurements on prototypes of increasing complexity, starting as early as possible.
Keywords :
computational fluid dynamics; consumer electronics; cooling; electronic data interchange; electronic design automation; flat panel displays; plasma displays; product development; risk management; television equipment; thermal management (packaging); 32 inch; CAD database; CFD; EISA award; computational fluid dynamics; continuous measurements; cooling design; energy density; fan cooling; market introduction timing schedule; measurement conditions; measurement plan; plasma display monitor; product development phases; prototype complexity; set behavior evaluation; systematic risk assessment; thermal design methodologies; unit geometry; Computational fluid dynamics; Cooling; Design methodology; Geometry; Monitoring; Plasma displays; Product development; Risk management; Spatial databases; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
Conference_Location :
San Jose, CA, USA
ISSN :
1065-2221
Print_ISBN :
0-7803-7327-8
Type :
conf
DOI :
10.1109/STHERM.2002.991356
Filename :
991356
Link To Document :
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