Title :
Study on sensitive character of unexpected high impedance circuit in VLSI failure analysis
Author_Institution :
Xiqing Econ. Dev. area, Freescale Semicond. (China) Ltd., Tianjin, China
fDate :
June 30 2014-July 4 2014
Abstract :
Microprobe analysis plays an important role in failure analysis as it could reveal the failed signal directly and help to isolate the final failed device. But when met unexpected high impedance circuit, the real signal couldn´t be measured as high impedance site was sensitive to probe needle and strong light. One real Case and experiment was studied in this paper to show how high impedance circuit was sensitive and how to find the root cause of this unstable failure efficiently.
Keywords :
VLSI; failure analysis; integrated circuit reliability; VLSI failure analysis; high impedance circuit; microprobe analysis; sensitive character; Failure analysis; Impedance; Impedance measurement; Integrated circuits; Needles; Probes; Temperature sensors;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium on the
Conference_Location :
Marina Bay Sands
Print_ISBN :
978-1-4799-3931-2
DOI :
10.1109/IPFA.2014.6898132
