Title :
On-line and off-line, analogue and digital, circuit and board, safety and reliability: how to solve the testing puzzle?
Author :
Lubaszewski, Marcelo ; Courtois, Bernard
Author_Institution :
INPG/TIMA, Grenoble, France
Abstract :
A unified methodology for the design for testability of critical systems is presented, which is based on merging the following complementary aspects of testing: off-line and on-line checking, analogue and digital, circuit and board testing, safety and reliability. Past and present developments undertaken in every aspect of this methodology are described, and future trends are briefly discussed
Keywords :
design for testability; integrated circuit testing; life testing; printed circuit testing; production testing; safety; analogue testing; board testing; critical systems; design for testability; digital testing; off-line checking; on-line checking; reliability; safety; Automatic testing; Built-in self-test; Circuit testing; Debugging; Electronic equipment testing; Integrated circuit interconnections; Integrated circuit testing; Prototypes; Safety; System testing;
Conference_Titel :
Circuits and Systems, 1994. APCCAS '94., 1994 IEEE Asia-Pacific Conference on
Conference_Location :
Taipei
Print_ISBN :
0-7803-2440-4
DOI :
10.1109/APCCAS.1994.514596
