DocumentCode :
2357878
Title :
Fouling of high density heat sinks - theoretical origins and numerical analysis
Author :
Montgomery, Stephen W.
Author_Institution :
Adv. Syst. Lab., Intel Corp., DuPont, WA, USA
fYear :
2002
fDate :
12-14 March 2002
Firstpage :
132
Lastpage :
136
Abstract :
Heat sinks and other components must operate in a thermal envelope that calls for continuous operation over long periods of time. Increasing thermal loads are resulting in widespread acceptance of densely packed heat sinks with closely spaced fins. However, the environment surrounding heat sinks and other electronic components is not ideal. Particulate contaminants are present in the ambient supply air in nearly every office, home or other zone of operation. These contaminants are ingested by the cooling systems and subsequently introduced to these heat sinks. Repeated exposure to particulate contamination can lead to the phenomena known as thermal fouling, where contaminant particles adhere themselves to the surface of the heat sink, acting as an insulating layer and thus reducing thermal performance. This analysis seeks to quantify the reduction in performance experienced by a dense pin fin array exposed to a contaminated operating environment. Results of numerical simulations illustrate the potentially drastic effects on fin effectiveness and overall airflow rate in a uniformly coated, fouled array. The fundamental theories of particulate adhesion are discussed and an experimental course of action for verification of the reduction in performance owing to fouling is suggested.
Keywords :
cooling; heat sinks; thermal conductivity; thermal management (packaging); closely spaced fins; dense pin fin array; densely packed heat sinks; fin effectiveness; high density heat sinks; insulating layer; overall airflow rate; particulate contaminants; thermal envelope; thermal fouling; thermal loads; thermal performance; Electronic components; Electronics cooling; Heat sinks; Insulation; Lead; Numerical simulation; Performance analysis; Space heating; Surface contamination; Thermal loading;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
Conference_Location :
San Jose, CA, USA
ISSN :
1065-2221
Print_ISBN :
0-7803-7327-8
Type :
conf
DOI :
10.1109/STHERM.2002.991358
Filename :
991358
Link To Document :
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