Title :
2002 cumulative bibliography of articles on semiconductor thermal measurement, management and modeling
Author :
Siegal, Bernard S.
Author_Institution :
Thermal Eng. Associates Inc., Menlo Park, CA, USA
Abstract :
The bibliography provides information on semiconductor thermal characteristics, measurement techniques and results, management techniques, hardware applications, modeling and computational techniques, and other pertinent information. Areas covered include thermal and temperature measurements, thermal management, device and package performance, modeling, computations, and software techniques.
Keywords :
bibliographies; integrated circuit measurement; modelling; packaging; bibliography; computational techniques; hardware applications; management techniques; modeling; package performance; semiconductor thermal measurement; software techniques; temperature measurements; thermal management; Application software; Bibliographies; Computational modeling; Computer applications; Hardware; Measurement techniques; Semiconductor device packaging; Software packages; Temperature measurement; Thermal management;
Conference_Titel :
Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-7327-8
DOI :
10.1109/STHERM.2002.991365