DocumentCode :
2358011
Title :
2002 cumulative bibliography of articles on semiconductor thermal measurement, management and modeling
Author :
Siegal, Bernard S.
Author_Institution :
Thermal Eng. Associates Inc., Menlo Park, CA, USA
fYear :
2002
fDate :
12-14 March 2002
Firstpage :
176
Lastpage :
196
Abstract :
The bibliography provides information on semiconductor thermal characteristics, measurement techniques and results, management techniques, hardware applications, modeling and computational techniques, and other pertinent information. Areas covered include thermal and temperature measurements, thermal management, device and package performance, modeling, computations, and software techniques.
Keywords :
bibliographies; integrated circuit measurement; modelling; packaging; bibliography; computational techniques; hardware applications; management techniques; modeling; package performance; semiconductor thermal measurement; software techniques; temperature measurements; thermal management; Application software; Bibliographies; Computational modeling; Computer applications; Hardware; Measurement techniques; Semiconductor device packaging; Software packages; Temperature measurement; Thermal management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
Conference_Location :
San Jose, CA, USA
ISSN :
1065-2221
Print_ISBN :
0-7803-7327-8
Type :
conf
DOI :
10.1109/STHERM.2002.991365
Filename :
991365
Link To Document :
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