Title :
An innovative method to overcome signal instability during TDR measurement of power MOSFET
Author :
Tan, S.Y. ; Ng, Kang Kee ; Gan, S.Y. ; Sin, C.K.
Author_Institution :
Infineon Technol. (Malaysia) Sdn. Bhd., Batu Berendam, Malaysia
fDate :
June 30 2014-July 4 2014
Abstract :
Hand probing is the most common technique being applied in Time Domain Reflectometry (TDR) measurement. It is a simple and easy method, but it produced instability on overall signal. Therefore, a new test fixture is designed to maximize its reproducibility. Repeatability test will be used to show its effectiveness on Power MOSFET. In addition, with the test fixture, the standard deviation for impedance results was σ=0.12 based on the same part for eight times measurement, compare to σ=3.26 with hand probing. Therefore a significant improvement on the repeatability test was clearly demonstrated.
Keywords :
power MOSFET; semiconductor device testing; time-domain reflectometry; TDR measurement; power MOSFET; repeatability test; signal instability; time domain reflectometry measurement; Fixtures; Force; Impedance; Impedance measurement; MOSFET; Probes; Transmission line measurements;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium on the
Conference_Location :
Marina Bay Sands
Print_ISBN :
978-1-4799-3931-2
DOI :
10.1109/IPFA.2014.6898150
