DocumentCode
2358200
Title
Discriminative parameter learning of general Bayesian network classifiers
Author
Shen, Bin ; Su, Xiaoyuan ; Greiner, Russell ; Musilek, Petr ; Cheng, Corrine
Author_Institution
Comput. Sci., Alberta Univ., Edmonton, Alta., Canada
fYear
2003
fDate
3-5 Nov. 2003
Firstpage
296
Lastpage
305
Abstract
Greiner and Zhou (1988) presented ELR, a discriminative parameter-learning algorithm that maximizes conditional likelihood (CL) for a fixed Bayesian belief network (BN) structure, and demonstrated that it often produces classifiers that are more accurate than the ones produced using the generative approach (OFE), which finds maximal likelihood parameters. This is especially true when learning parameters for incorrect structures, such as naive Bayes (NB). In searching for algorithms to learn better BN classifiers, this paper uses ELR to learn parameters of more nearly correct BN structures - e.g., of a general Bayesian network (GBN) learned from a structure-learning algorithm by Greiner and Zhou (2002). While OFE typically produces more accurate classifiers with GBN (vs. NB), we show that ELR does not, when the training data is not sufficient for the GBN structure learner to produce a good model. Our empirical studies also suggest that the better the BN structure is, the less advantages ELR has over OFE, for classification purposes. ELR learning on NB (i.e., with little structural knowledge) still performs about the same as OFE on GBN in classification accuracy, over a large number of standard benchmark datasets.
Keywords
Bayes methods; algorithm theory; belief networks; learning (artificial intelligence); maximum likelihood estimation; Bayesian belief network; Bayesian network classifier; benchmark dataset; classification accuracy; conditional likelihood maximization; discriminative parameter learning; extended logic regression; generative approach; maximal likelihood parameter; naive Bayes; observed frequency estimates; structural knowledge; structure-learning algorithm; Bayesian methods; Computer networks; Data mining; Fault diagnosis; Frequency estimation; Logistics; Machine learning; Niobium; Pattern recognition; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Tools with Artificial Intelligence, 2003. Proceedings. 15th IEEE International Conference on
ISSN
1082-3409
Print_ISBN
0-7695-2038-3
Type
conf
DOI
10.1109/TAI.2003.1250204
Filename
1250204
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