Title :
Programmable logic gate based on controlled quenching of series-connected negative differential resistance devices
Author :
Chen, K.J. ; Waho, T. ; Maezawa, K. ; Yamamoto, M.
Author_Institution :
NTT LSI Labs., Kanagawa, Japan
Abstract :
The unique characteristics of resonant-tunneling (RT) devices, such as the negative differential resistance (NDR), can be used to construct compact functional circuits. In this work, we propose and experimentally demonstrate a new circuit that takes full advantage of the NDR feature in RT devices. The circuit features three NDR devices connected in series and is driven by a clocked bias voltage V/sub BIAS/. The function of the circuit can be selected as one of the six logic functions (AND, OR, NAND, NOR, XOR, and XNOR) by control voltages and the amplitude of V/sub BIAS/. This flexible functionality indicates that our circuit can be applied to the implementation of programmable logic circuits, which will provide cost-effective prototypes for modern circuit designs.
Keywords :
active networks; logic gates; negative resistance devices; programmable logic devices; resonant tunnelling devices; clocked bias voltage; compact functional circuit; controlled quenching; programmable logic gate; resonant-tunneling devices; series-connected negative differential resistance devices; Clocks; Logic devices; Logic functions; Logic gates; Programmable control; Programmable logic arrays; Programmable logic devices; RLC circuits; Resonant tunneling devices; Voltage;
Conference_Titel :
Device Research Conference, 1996. Digest. 54th Annual
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-3358-6
DOI :
10.1109/DRC.1996.546423