• DocumentCode
    2358320
  • Title

    Reliability of palladium coated copper wire

  • Author

    Stephan, Dominik ; Wulff, Frank W. ; Milke, Eugen

  • Author_Institution
    Heraeus Mater. Singapore Pte Ltd., Singapore, Singapore
  • fYear
    2010
  • fDate
    8-10 Dec. 2010
  • Firstpage
    343
  • Lastpage
    348
  • Abstract
    Alternative solutions for Au wire are high in demand as a result of increasing gold price and high demand for lower cost packages. Copper wire has been the natural low cost alternative but concerns on corrosion susceptibility and package reliability have driven the industry to look for better alternative wire materials while maintaining substantial material cost savings. PdCu wire is supposed to close this gap and serves a promising solution for applications that require cost effectiveness (still significant cost saving over gold) and robust bonding performance (closer to that of gold wire). One critical question in the industry currently is, whether or not PdCu wire can address the reliability concerns, which are occurring at some copper wire applications in the field. This paper will cover the intermetallic phase growth of PdCu wire on Al pad metallization at as bonded condition and tries to understand whether or not there is any difference at the interface compared to bare copper, during initial bonding and during reliability testing like HTS, HAST and PCT.
  • Keywords
    coating techniques; copper; corrosion; electronics packaging; metallisation; palladium; reliability; Al pad metallization; HAST; HTS; PCT; PdCu; corrosion susceptibility; cost effectiveness; intermetallic phase growth; package reliability; palladium coated copper wire; reliability testing; robust bonding; FAB; Intermetallic; PdCu wire; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2010 12th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-8560-4
  • Electronic_ISBN
    978-1-4244-8561-1
  • Type

    conf

  • DOI
    10.1109/EPTC.2010.5702660
  • Filename
    5702660