• DocumentCode
    2358466
  • Title

    81 GHz gain-bandwidth product silicon hetero-interface photodetector

  • Author

    Hawkins, A.R. ; Reynolds, T. ; England, D. ; Babic, D.I. ; Streubel, K. ; Bowers, J.E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • fYear
    1996
  • fDate
    26-26 June 1996
  • Firstpage
    198
  • Lastpage
    199
  • Abstract
    Summary form only given. We have fabricated and tested avalanche photodetectors operating in the wavelength range between 1.O and 1.65 /spl mu/m that use separate InGaAs absorption and Si multiplication regions bonded through wafer fusion. Directly integrating InGaAs and Si layers in an avalanche photodetector combines the infrared absorption capabilities of InGaAs and the avalanche multiplication properties of Si. The large ratio of electron and hole ionization coefficients of Si should result in a much lower noise and ten times higher gain-bandwidth products for these detectors than for comparable avalanche photodetectors (APDs) using III-V semiconductors in multiplication regions. Silicon Hetero-Interface Photo (SHIP) detectors were recently reported and the device reported here has a much improved design resulting in ten times higher gain. The first dynamic measurements are also reported here, with a high gain-bandwidth product of 81 GHz.
  • Keywords
    III-V semiconductors; avalanche breakdown; avalanche photodiodes; gallium arsenide; indium compounds; infrared detectors; photodetectors; 1.0 to 1.65 micrometre; III-V semiconductors; InGaAs-Si; absorption region; avalanche multiplication properties; avalanche photodetectors; dynamic measurements; gain-bandwidth products; hetero-interface photodetector; infrared absorption capabilities; ionization coefficients; multiplication region; wafer fusion; Charge carrier processes; Electromagnetic wave absorption; Indium gallium arsenide; Infrared detectors; Ionization; Photodetectors; Signal to noise ratio; Silicon; Testing; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1996. Digest. 54th Annual
  • Conference_Location
    Santa Barbara, CA, USA
  • Print_ISBN
    0-7803-3358-6
  • Type

    conf

  • DOI
    10.1109/DRC.1996.546435
  • Filename
    546435