DocumentCode
2358466
Title
81 GHz gain-bandwidth product silicon hetero-interface photodetector
Author
Hawkins, A.R. ; Reynolds, T. ; England, D. ; Babic, D.I. ; Streubel, K. ; Bowers, J.E.
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fYear
1996
fDate
26-26 June 1996
Firstpage
198
Lastpage
199
Abstract
Summary form only given. We have fabricated and tested avalanche photodetectors operating in the wavelength range between 1.O and 1.65 /spl mu/m that use separate InGaAs absorption and Si multiplication regions bonded through wafer fusion. Directly integrating InGaAs and Si layers in an avalanche photodetector combines the infrared absorption capabilities of InGaAs and the avalanche multiplication properties of Si. The large ratio of electron and hole ionization coefficients of Si should result in a much lower noise and ten times higher gain-bandwidth products for these detectors than for comparable avalanche photodetectors (APDs) using III-V semiconductors in multiplication regions. Silicon Hetero-Interface Photo (SHIP) detectors were recently reported and the device reported here has a much improved design resulting in ten times higher gain. The first dynamic measurements are also reported here, with a high gain-bandwidth product of 81 GHz.
Keywords
III-V semiconductors; avalanche breakdown; avalanche photodiodes; gallium arsenide; indium compounds; infrared detectors; photodetectors; 1.0 to 1.65 micrometre; III-V semiconductors; InGaAs-Si; absorption region; avalanche multiplication properties; avalanche photodetectors; dynamic measurements; gain-bandwidth products; hetero-interface photodetector; infrared absorption capabilities; ionization coefficients; multiplication region; wafer fusion; Charge carrier processes; Electromagnetic wave absorption; Indium gallium arsenide; Infrared detectors; Ionization; Photodetectors; Signal to noise ratio; Silicon; Testing; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 1996. Digest. 54th Annual
Conference_Location
Santa Barbara, CA, USA
Print_ISBN
0-7803-3358-6
Type
conf
DOI
10.1109/DRC.1996.546435
Filename
546435
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