DocumentCode
2358542
Title
Propagation and diagnosis faulty LUTs in an FPGA
Author
Kumar, T. Nandha
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Nottingham, Semenyih, Malaysia
fYear
2010
fDate
8-10 Dec. 2010
Firstpage
399
Lastpage
403
Abstract
This paper proposes a new technique for propagation and diagnosis the faulty LUTs (Look Up Tables) in an FPGA (Field Programmable Gate Arrays) using a simple parallel in serial out shift register. The proposed fault propagation design helps in diagnosing the multiple faulty LUTs precisely by avoiding any fault masking. This method has been tested on the commercial FPGA and the experimental results are provided. The experimental result shows that time taken to test 4656 LUTs exhaustively is 196 seconds.
Keywords
field programmable gate arrays; shift registers; FPGA; fault propagation design; faulty look up tables diagnosis; field programmable gate arrays; parallel in serial out shift register; time 196 s; FPGA testing; Fault diagnosis; Fault propagation; LUT testing; multiple LUT faults;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location
Singapore
Print_ISBN
978-1-4244-8560-4
Electronic_ISBN
978-1-4244-8561-1
Type
conf
DOI
10.1109/EPTC.2010.5702671
Filename
5702671
Link To Document