• DocumentCode
    2358542
  • Title

    Propagation and diagnosis faulty LUTs in an FPGA

  • Author

    Kumar, T. Nandha

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Nottingham, Semenyih, Malaysia
  • fYear
    2010
  • fDate
    8-10 Dec. 2010
  • Firstpage
    399
  • Lastpage
    403
  • Abstract
    This paper proposes a new technique for propagation and diagnosis the faulty LUTs (Look Up Tables) in an FPGA (Field Programmable Gate Arrays) using a simple parallel in serial out shift register. The proposed fault propagation design helps in diagnosing the multiple faulty LUTs precisely by avoiding any fault masking. This method has been tested on the commercial FPGA and the experimental results are provided. The experimental result shows that time taken to test 4656 LUTs exhaustively is 196 seconds.
  • Keywords
    field programmable gate arrays; shift registers; FPGA; fault propagation design; faulty look up tables diagnosis; field programmable gate arrays; parallel in serial out shift register; time 196 s; FPGA testing; Fault diagnosis; Fault propagation; LUT testing; multiple LUT faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2010 12th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-8560-4
  • Electronic_ISBN
    978-1-4244-8561-1
  • Type

    conf

  • DOI
    10.1109/EPTC.2010.5702671
  • Filename
    5702671