DocumentCode :
2358684
Title :
Effect of addition Cobalt nanoparticles on Sn-Ag-Cu lead-free solder
Author :
Tay, S.L. ; Haseeb, A.S.M.A. ; Johan, Mohd Rafie
Author_Institution :
Dept. of Mech. Eng., Univ. of Malaya, Kuala Lumpur, Malaysia
fYear :
2010
fDate :
8-10 Dec. 2010
Firstpage :
433
Lastpage :
436
Abstract :
Nowadays, nanoelectroctronic, electro-nanotechnologies environmental friendly products become the roadmap in industry. Hence, nanoscale of reinforcement into lead-free solder becomes more popular rather than the micro size of reinforcement. In this paper, Cobalt nanoparticles-reinforced Sn-Ag-Cu composite solders were prepared by thoroughly blending 0.75 wt% of cobalt nanoparticles with near eutectic cement tended to suppress the growth of Cu3Sn intermetallic layer. However, upon addition of Co nanoparticles, the growth of Cu6Sn5 was enhanced. The distribution of the Co nanoparticles was observed by the elemental mapping which was carried out by using electron micro probe analysis (EPMA) and transmission electron microscopy which equipped together with electron-dispersive X-ray spectroscopy (TEM-EDX). There was no Co detected in the Cu3Sn, it only presented in Cu6Sn5. The interdiffusion coefficient was increased with the ageing temperature. Upon addition of Co nanoparticles, the interdiffusion coefficient for the formation of Cu3Sn intermetallic layer was reduced, but the interdiffusion coefficient for the formation of Cu6Sn5 layer was increased. The activation energy for the formation of Cu3Sn was also increased with the Co addition.
Keywords :
X-ray chemical analysis; ageing; blending; chemical interdiffusion; cobalt; composite materials; copper alloys; electron probe analysis; nanoparticles; nanotechnology; silver alloys; solders; tin alloys; transmission electron microscopy; Co; Cu3Sn; Cu6Sn5; Sn-Ag-Cu; TEM-EDX; ageing temperature; blending; cobalt nanoparticles; electron microprobe analysis; electron-dispersive X-ray spectroscopy; electronanotechnology; environmental friendly products; eutectic cement; interdiffusion coefficient; lead-free solder; nanoelectroctronic; reinforced composite solders; transmission electron microscopy; Lead-free solder; cobalt nanoparticles; intermetallic layer; nanoparticles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-8560-4
Electronic_ISBN :
978-1-4244-8561-1
Type :
conf
DOI :
10.1109/EPTC.2010.5702678
Filename :
5702678
Link To Document :
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