DocumentCode
2358875
Title
Thermomechanical description of interface formation in aluminum ultrasound (US)-wedge/wedge-wirebond contacts
Author
Müller, Wolfgang H. ; Sbeiti, Mohamad ; Schneider-Ramelow, Martin ; Geissler, Ute
Author_Institution
Inst. fur Mechanik, Tech. Univ. Berlin, Berlin, Germany
fYear
2010
fDate
8-10 Dec. 2010
Firstpage
473
Lastpage
478
Abstract
Wire-bonding is and will stay one of the essential interconnection methods in electronic packaging. Physics-based modeling of interconnects between the wire material and the substrate metallization has been constantly advanced over the last five years. Due to the variety and complexity of the mechanisms occurring during bonding it is required to clarify some open issues for a thorough interpretation of the metallurgical processes that take place at the interface of the weld and in the wire. One of these issues relates to the thermo-mechanical processes at or in the vicinity in the interface between the wire and the substrate during an ultrasonic wedge/wedge wire-bonding. These processes shall be qualified by a micro-thermomechanical model and also incorporated quantitatively in the bonding process. In this paper a thermomechanical analysis of ultrasonic wire bonding is performed by means of 3D finite element (FE) simulations. On the wire the bonding force is applied as well as ultrasonic vibration, which causes shear stresses in the wire and a frictional movement between the wire and the pad. The change of temperature in the interface between the aluminum wire and the gold metallization of a copper-nickel pad is studied. It is shown that a rise of temperature is obtained due to the plastic deformation of the wire caused by the bonding force, the shear stresses and by the friction with the pad. It is also shown that the maximum temperature is still lower than the temperature required for a proper material transport, proofing that this temperature rise cannot be alone responsible for ultrasonic wire bonding.
Keywords
aluminium; electronics packaging; finite element analysis; lead bonding; metallisation; thermomechanical treatment; ultrasonic bonding; vibrations; 3D finite element simulation; aluminum wire; bonding force; copper-nickel pad; electronic packaging; frictional movement; gold metallization; interconnection method; interface formation; metallurgical process; micro-thermomechanical model; physics-based modeling; plastic deformation; shear stress; substrate metallization; thermo-mechanical process; thermomechanical description; ultrasonic vibration; ultrasonic wire-bonding; ultrasound wedge/wedge-wirebond contact;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location
Singapore
Print_ISBN
978-1-4244-8560-4
Electronic_ISBN
978-1-4244-8561-1
Type
conf
DOI
10.1109/EPTC.2010.5702686
Filename
5702686
Link To Document