DocumentCode :
2358901
Title :
Copper wire bonding - A maturing technology
Author :
Appelt, Bernd K. ; Tseng, Andy ; Lai, Yi-Shao ; Chen, Chun-Hsiung
Author_Institution :
ASE Group, Santa Clara, CA, USA
fYear :
2010
fDate :
8-10 Dec. 2010
Firstpage :
479
Lastpage :
483
Abstract :
Wire bonding has been the dominant mode of chip to substrate interconnection for many decades. The most common metal used has been gold which is rather malleable and very resistant to oxidation and corrosion. The surge in commodity prices over the last few years has prompted the introduction of copper as a lower cost alternative. While copper has some advantages electrically, thermally and mechanically, it presents also many challenges due to the mechanical properties as well as its propensity for oxidation and corrosion. Here, the successful introduction of fine diameter copper wire bonding into high volume manufacturing is described.
Keywords :
copper alloys; corrosion; gold; integrated circuit interconnections; lead bonding; oxidation; commodity prices; corrosion resistant; fine diameter copper wire bonding; gold; high volume manufacturing; malleable; maturing technology; mechanical property; oxidation resistant; substrate interconnection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-8560-4
Electronic_ISBN :
978-1-4244-8561-1
Type :
conf
DOI :
10.1109/EPTC.2010.5702687
Filename :
5702687
Link To Document :
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