DocumentCode
2358901
Title
Copper wire bonding - A maturing technology
Author
Appelt, Bernd K. ; Tseng, Andy ; Lai, Yi-Shao ; Chen, Chun-Hsiung
Author_Institution
ASE Group, Santa Clara, CA, USA
fYear
2010
fDate
8-10 Dec. 2010
Firstpage
479
Lastpage
483
Abstract
Wire bonding has been the dominant mode of chip to substrate interconnection for many decades. The most common metal used has been gold which is rather malleable and very resistant to oxidation and corrosion. The surge in commodity prices over the last few years has prompted the introduction of copper as a lower cost alternative. While copper has some advantages electrically, thermally and mechanically, it presents also many challenges due to the mechanical properties as well as its propensity for oxidation and corrosion. Here, the successful introduction of fine diameter copper wire bonding into high volume manufacturing is described.
Keywords
copper alloys; corrosion; gold; integrated circuit interconnections; lead bonding; oxidation; commodity prices; corrosion resistant; fine diameter copper wire bonding; gold; high volume manufacturing; malleable; maturing technology; mechanical property; oxidation resistant; substrate interconnection;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location
Singapore
Print_ISBN
978-1-4244-8560-4
Electronic_ISBN
978-1-4244-8561-1
Type
conf
DOI
10.1109/EPTC.2010.5702687
Filename
5702687
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