• DocumentCode
    2358901
  • Title

    Copper wire bonding - A maturing technology

  • Author

    Appelt, Bernd K. ; Tseng, Andy ; Lai, Yi-Shao ; Chen, Chun-Hsiung

  • Author_Institution
    ASE Group, Santa Clara, CA, USA
  • fYear
    2010
  • fDate
    8-10 Dec. 2010
  • Firstpage
    479
  • Lastpage
    483
  • Abstract
    Wire bonding has been the dominant mode of chip to substrate interconnection for many decades. The most common metal used has been gold which is rather malleable and very resistant to oxidation and corrosion. The surge in commodity prices over the last few years has prompted the introduction of copper as a lower cost alternative. While copper has some advantages electrically, thermally and mechanically, it presents also many challenges due to the mechanical properties as well as its propensity for oxidation and corrosion. Here, the successful introduction of fine diameter copper wire bonding into high volume manufacturing is described.
  • Keywords
    copper alloys; corrosion; gold; integrated circuit interconnections; lead bonding; oxidation; commodity prices; corrosion resistant; fine diameter copper wire bonding; gold; high volume manufacturing; malleable; maturing technology; mechanical property; oxidation resistant; substrate interconnection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2010 12th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-8560-4
  • Electronic_ISBN
    978-1-4244-8561-1
  • Type

    conf

  • DOI
    10.1109/EPTC.2010.5702687
  • Filename
    5702687