• DocumentCode
    2358980
  • Title

    The impact of semiconductor packaging technologies on system integration an overview

  • Author

    Cognetti, Carlo

  • Author_Institution
    Corp. Package Dev. Dept., STMicroelectronics, Agrate Brianza, Italy
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    24
  • Lastpage
    28
  • Abstract
    We are crossing the threshold of the third revolution in semiconductor packaging. In the ´80s, surface mount technology (SMT) had major impact on size reduction of all electronic systems. In the 90´s, ball grid array (BGA) has been introduced, whose latest evolution allows further dramatic steps in miniaturization, with cost effective production of 3-dimensional structures and the integration of a large number of passive and active devices in the same package (System in Package - SiP). 3D-BGA platform is now well established and offers an alternative to System on Chip (SoC), i.e. the full integration at chip level. With the additional possibility of combining ldquoheterogeneousrdquo devices. But BGA is getting close to its intrinsic limits and will not be able to serve the requirements (size, speed, thermal dissipation, cost) of next advanced systems, like future wireless applications. At present, most of R&D effort is dedicated to the development of new concepts, mixing conventional assembly and ldquoon waferrdquo processes. The result is the ldquo3D Wafer Levelrdquo platform, which will provide unprecedented levels of integration, with several breakthroughs in design, manufacturing infrastructure, supply chain.
  • Keywords
    ball grid arrays; chip scale packaging; surface mount technology; system-in-package; wafer level packaging; 3D structures; 3D wafer level platform; 3D-BGA platform; SMT; SiP technology; active devices; ball grid array; chip level integration; electronic system integration; heterogeneous devices; intrinsic limits; on wafer processes; passive devices; semiconductor packaging technology; surface mount technology; system in package; thermal dissipation; Semiconductor device packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 2009. ESSDERC '09. Proceedings of the European
  • Conference_Location
    Athens
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4244-4351-2
  • Electronic_ISBN
    1930-8876
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2009.5331372
  • Filename
    5331372