Title :
Proceedings. 4th International Workshop on Microprocessor Test and Verification - Common Challenges and Solutions
Abstract :
The following topics are dealt with: functional test generation; system-on-chip verification; custom-made high performance design; fault diagnosis; automatic test pattern generation; embedded system validation; simulation techniques; logic debugging; and microprocessor design verification.
Keywords :
automatic test pattern generation; circuit testing; fault diagnosis; formal verification; microprocessor chips; automatic test pattern generation; custom-made high performance design; embedded system validation; fault diagnosis; functional test generation; logic debugging; microprocessor design verification; simulation techniques; system-on-chip verification; Circuit testing; Fault diagnosis; Microprocessors;
Conference_Titel :
Microprocessor Test and Verification: Common Challenges and Solutions, 2003. Proceedings. 4th International Workshop on
Conference_Location :
Austin, TX, USA
Print_ISBN :
0-7695-2045-6
DOI :
10.1109/MTV.2003.1250254
