DocumentCode :
2359235
Title :
Simulation of drop testing at extremely high accelerations
Author :
Douglas, S. ; Al-Bassyiouni, M. ; Dasgupta, A.
Author_Institution :
Mech. Eng. Dept., Univ. of Maryland, College Park, TX, USA
fYear :
2010
fDate :
26-28 April 2010
Firstpage :
1
Lastpage :
7
Abstract :
Advances in drop tower technology have extended the range of obtainable accelerations in drop testing from 5,000 Gs to as much as 100,000 Gs. To achieve excitations in excess of the conventional 5,000 Gs, a mechanical accelerator, called the Dual Mass Shock Amplifier (DMSA), is mounted on the drop table. This device produces extremely high, short duration shock amplitudes, by using secondary impacts. In this study, we use transient finite element analysis with nonlinear contact elements, to assess the DMSA table acceleration response profile (height and width) as a function of different system parameters like DMSA design parameters, programmer configuration, drop height, etc. DMSA design variables include table weight, height of the rebound travel rods, stiffness of rebound springs, and rebound damper materials. The programmer configuration includes: (i) height, diameter, material and surface shape of the programmer cylinder that is placed between the drop table and the shock table; (ii) thickness and damping coefficients of the programmer layers placed between the DMSA base and DMSA table; (iii) programmer tubes between the DMSA table and the DMSA rebound stopper bar. Contact elements in the finite element analysis (FEA) are introduced between the shock and drop tables and also between the DMSA base, DMSA table and DMSA rebound stopper bar. Specimen fixtures of different weights are introduced on the DMSA table to see the effect of the payload weight. The effect of these variables in the DMSA table acceleration profile are parametrically explored.
Keywords :
amplifiers; consumer electronics; electron device testing; finite element analysis; shock absorbers; springs (mechanical); DMSA rebound stopper bar; DMSA table acceleration response profile; damping coefficients; drop tables; drop testing; drop tower technology; dual mass shock amplifier; extremely high accelerations; finite element analysis; handheld consumer electronics; mechanical accelerator; nonlinear contact elements; programmer cylinder; shock tables; Acceleration; Damping; Electric shock; Finite element methods; Life estimation; Poles and towers; Programming profession; Springs; Testing; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE), 2010 11th International Conference on
Conference_Location :
Bordeaux
Print_ISBN :
978-1-4244-7026-6
Type :
conf
DOI :
10.1109/ESIME.2010.5464528
Filename :
5464528
Link To Document :
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