• DocumentCode
    2359278
  • Title

    Effect of micro structure on fatigue characteristics of lead free solder joints

  • Author

    Akutsu, Takahiro ; Yu, Qiang ; Nishimura, Yuji

  • Author_Institution
    Dept. of Mech. Eng. & Mater. Sci., Yokohama Nat. Univ., Yokohama, Japan
  • fYear
    2010
  • fDate
    8-10 Dec. 2010
  • Firstpage
    550
  • Lastpage
    555
  • Abstract
    This paper presents the influence of the micro structure on the crack propagation in lead free solder joint. The author´s group have studied the Manson-Coffin´s law for lead free solder joint by using the isothermal fatigue test and FEM analytical approaches to establish the practicable evaluation of thermal fatigue life of solder joints, for example, for the Sn-Cu solder, because this solder is attracted from the aspect of the decrease of solder leach in the flow process and material cost. However, even if the same loading is given to the solder joints of BGA test piece, there was a large dispersion in the fatigue life. Even though the effect of the shape difference has been considered, the range of the dispersion could not been explained sufficiently. In the study, the fatigue crack propagation modes in the solder joints were investigated, and an internal fatigue crack mode and an interfacial fatigue crack mode were confirmed. And the tendency of a shorter on fatigue life in the interfacial fatigue mode was confirmed. To clarify the mechanism of these fatigue crack modes, the crystal grain size in the solder joints was investigated before the fatigue test and also after the test. Furthermore, the verification of the mechanism using FEM models considering the crystal grain size was carried out. First of all, each element in FEM models matching to the average crystal grain size was made. Second, the inelastic strain ranges in each FEM models were studied. As a result, it was shown that the influence of the crystal grain size to the fatigue crack progress can be evaluated.
  • Keywords
    fatigue cracks; fatigue testing; finite element analysis; semiconductor device manufacture; semiconductor technology; solders; thermal stress cracking; BGA test piece; FEM model; Manson-Coffin law; fatigue crack propagation; inelastic strain range; isothermal fatigue test; lead free solder joints; micro structure effect; thermal fatigue life;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2010 12th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-8560-4
  • Electronic_ISBN
    978-1-4244-8561-1
  • Type

    conf

  • DOI
    10.1109/EPTC.2010.5702700
  • Filename
    5702700