DocumentCode :
2359535
Title :
Author index
fYear :
2003
fDate :
30-30 May 2003
Firstpage :
125
Lastpage :
125
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification: Common Challenges and Solutions, 2003. Proceedings. 4th International Workshop on
Conference_Location :
Austin, TX, USA
Print_ISBN :
0-7695-2045-6
Type :
conf
DOI :
10.1109/MTV.2003.1250273
Filename :
1250273
Link To Document :
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