مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2359535

Title :

Author index

fYear :

2003

fDate :

30-30 May 2003

Firstpage :

125

Lastpage :

125

Abstract :

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Microprocessor Test and Verification: Common Challenges and Solutions, 2003. Proceedings. 4th International Workshop on

Conference_Location :

Austin, TX, USA

Print_ISBN :

0-7695-2045-6

Type :

conf

DOI :

10.1109/MTV.2003.1250273

Filename :

1250273

Link To Document :