Modeling and characterization of reverse recovery performance of high-power GaAs Schottky and silicon P-i-N rectifiers

The reverse recovery characteristics of high-power GaAs Schottky and silicon P-i-N rectifiers are studied at various temperatures. Devices were first characterized to obtain measured data for forward and reverse I-V, C-V, reverse breakdown voltage, and reverse recovery performance and then simulated using an advanced two-dimensional (2-D) mixed device and circuit simulator. The measured and simulated results show significant reduction in reverse recovery tail-current for the GaAs Schottky rectifier. At higher temperatures, the reverse recovery performance of the GaAs Schottky rectifier improves while that of the silicon P-i-N rectifier is degraded. These results represent the first demonstration and application of mixed device and circuit simulation in accurately predicting the reverse recovery performance of power rectifiers