Title :
Single event effect and radiation damage results for candidate spacecraft electronics
Author :
Bryan, Martha V O ; LaBel, Kenneth A. ; Reed, Robert A. ; Barth, Janet L. ; Seidleck, Christina M. ; Marshall, Peter ; Marshall, Paul ; Carts, Martin
Author_Institution :
Jackson & Tull Chartered Eng., Washington, DC, USA
Abstract :
We present both heavy ion and proton single event effect (SEE) and radiation damage ground test results for candidate spacecraft electronics. Devices tested include optocouplers, programmable devices, and fiber links
Keywords :
analogue integrated circuits; analogue-digital conversion; digital-analogue conversion; integrated circuit testing; integrated logic circuits; integrated memory circuits; ion beam effects; optical communication equipment; opto-isolators; programmable logic devices; proton effects; space vehicle electronics; ADC; DAC; analog ICs; digital ICs; fiber link equipment; ground test results; heavy ion SEE; optocouplers; programmable devices; proton SEE; radiation damage; single event effect; spacecraft electronics; Aerospace electronics; Electronic equipment testing; Laboratories; Neutrons; Performance evaluation; Protons; Single event upset; Space vehicles; Test facilities; User centered design;
Conference_Titel :
Radiation Effects Data Workshop, 1998. IEEE
Conference_Location :
Newport Beach, CA
Print_ISBN :
0-7803-5109-6
DOI :
10.1109/REDW.1998.731469
