Title :
Controlling Fermi level in single layer graphene QHE device for resistance standard
Author :
Fukuyama, Yasuhiro ; Elmquist, Randolph E. ; Lung-I Huang ; Yanfei Yang ; Fan-Hung Liu ; Kaneko, Nobu-hisa
Author_Institution :
Nat. Metrol. Inst. of Japan (NMIJ/AIST), Tsukuba, Japan
Abstract :
NMIJ/AIST and NIST are collaborating on the development of graphene-based quantized Hall resistance (QHR) devices. We formed graphene films on SiC(0001) substrates and processed the samples into Hall bar devices using the NIST clean room facility. The electronic transport properties have been observed at the NIST and NMIJ/AIST. We used two methods to control the Fermi level in the samples. One is hydrogen intercalation and the other is photochemical gating. Using the former technique, the Fermi level moved across the Dirac point. For the latter technique, it moved closer to the Dirac point.
Keywords :
Fermi level; Hall effect devices; electric resistance measurement; graphene; level control; photochemistry; quantum Hall effect; C; Dirac point; Fermi level control; Hall bar device; NIST clean room facility; NMIJ-AIST; QHR device; SiC; electronic transport property; graphene film; graphene-based quantized Hall resistance device; hydrogen intercalation; photochemical gating; resistance standard; single layer graphene QHE device; Charge carrier density; Graphene; Hydrogen; NIST; Resistance; Silicon carbide; Substrates; Graphene; Quantized Hall Resistance; Quantum Hall Effect; Quantum Standard; Resistance Standard;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898246