• DocumentCode
    2359764
  • Title

    Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors

  • Author

    Crain, S.H. ; Crain, W.R. ; Crawford, K.B. ; Hansel, S.J. ; Yu, P. ; Koga, R.

  • Author_Institution
    Aerosp. Corp., El Segundo, CA, USA
  • fYear
    1998
  • fDate
    36000
  • Firstpage
    51
  • Lastpage
    57
  • Abstract
    Two generations of the 80Cx86 microprocessor family and two floating-point digital signal processor (DSP) of the SMJ320Cx0 family were tested for single event effects (SEE). The test results are presented here
  • Keywords
    CMOS digital integrated circuits; digital signal processing chips; integrated circuit testing; logic testing; microprocessor chips; radiation effects; 80C186 microprocessor; 80C286 microprocessor; 80Cx86 microprocessor family; SMJ320C30 DSP chip; SMJ320C40 DSP chip; SMJ320Cx0 DSP family; digital signal processors; floating-point DSPs; single event effects test results; Aerospace testing; Arithmetic; Circuit testing; Digital signal processing; Logic devices; Logic testing; Microprocessors; Read-write memory; Registers; Samarium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 1998. IEEE
  • Conference_Location
    Newport Beach, CA
  • Print_ISBN
    0-7803-5109-6
  • Type

    conf

  • DOI
    10.1109/REDW.1998.731471
  • Filename
    731471
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2359764