Title :
Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors
Author :
Crain, S.H. ; Crain, W.R. ; Crawford, K.B. ; Hansel, S.J. ; Yu, P. ; Koga, R.
Author_Institution :
Aerosp. Corp., El Segundo, CA, USA
Abstract :
Two generations of the 80Cx86 microprocessor family and two floating-point digital signal processor (DSP) of the SMJ320Cx0 family were tested for single event effects (SEE). The test results are presented here
Keywords :
CMOS digital integrated circuits; digital signal processing chips; integrated circuit testing; logic testing; microprocessor chips; radiation effects; 80C186 microprocessor; 80C286 microprocessor; 80Cx86 microprocessor family; SMJ320C30 DSP chip; SMJ320C40 DSP chip; SMJ320Cx0 DSP family; digital signal processors; floating-point DSPs; single event effects test results; Aerospace testing; Arithmetic; Circuit testing; Digital signal processing; Logic devices; Logic testing; Microprocessors; Read-write memory; Registers; Samarium;
Conference_Titel :
Radiation Effects Data Workshop, 1998. IEEE
Conference_Location :
Newport Beach, CA
Print_ISBN :
0-7803-5109-6
DOI :
10.1109/REDW.1998.731471
