DocumentCode :
2360018
Title :
Thermo-mechanical analysis of flexible and stretchable systems
Author :
Gonzalez, Mario ; Vandevelde, Bart ; Christiaens, Wim ; Hsu, Yung-Yu ; Iker, Francois ; Bossuyt, Frederick ; Vanfleteren, Jan ; Van der Sluis, Olaf ; Timmermans, P.H.M.
Author_Institution :
IMEC, Leuven, Belgium
fYear :
2010
fDate :
26-28 April 2010
Firstpage :
1
Lastpage :
7
Abstract :
This paper presents a summary of the modeling and technology developed for flexible and stretchable electronics. The integration of ultra thin dies at package level, with thickness in the range of 20 to 30 ¿m, into flexible and/or stretchable materials are demonstrated as well as the design and reliability test of stretchable metal interconnections at board level are analyzed by both experiments and finite element modeling. These technologies can achieve mechanically bendable and stretchable subsystems. The base substrate used for the fabrication of flexible circuits is a uniform polyimide layer, while silicones materials are preferred for the stretchable circuits. The method developed for chip embedding and interconnections is named Ultra Thin Chip Package (UTCP). Extensions of this technology can be achieved by stacking and embedding thin dies in polyimide, providing large benefits in electrical performance and still allowing some mechanical flexibility. These flexible circuits can be converted into stretchable circuits by replacing the relatively rigid polyimide by a soft and elastic silicone material. We have shown through finite element modeling and experimental validation that an appropriate thermo mechanical design is necessary to achieve mechanically reliable circuits and thermally optimized packages.
Keywords :
electronics packaging; finite element analysis; flexible electronics; flip-chip devices; thermomechanical treatment; chip embedding; finite element modeling; flexible electronics; stretchable electronics; thermo-mechanical analysis; ultra thin chip package; ultra thin dies; Circuit testing; Electronic packaging thermal management; Finite element methods; Flexible printed circuits; Inorganic materials; Integrated circuit interconnections; Integrated circuit reliability; Materials reliability; Polyimides; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE), 2010 11th International Conference on
Conference_Location :
Bordeaux
Print_ISBN :
978-1-4244-7026-6
Type :
conf
DOI :
10.1109/ESIME.2010.5464566
Filename :
5464566
Link To Document :
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