Title :
Reflow study of Pb-free Sn-3.5Ag solder with Ni-Sn-P metallization
Author :
Yang, Y. ; Balaraju, J.N. ; Chen, Z.
Author_Institution :
Sch. of Mater. Sci. & Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
Electrolessly plated Ni-P has been extensively studied due to its high coating uniformity, selectivity and low coating stress. However, the use of lead-free solders accelerates interfacial reaction because they have higher melting points and higher Sn content than the conventional Pb-Sn solders. In this work, we developed a ternary electroless Ni-Sn-P (6~7 wt.% of P and 15~17 wt.% of Sn) alloy to be used as the soldering metallization. Besides having good solderability, the presence of Sn in electroless Ni-Sn-P changes the diffusion process during soldering reflow. Comparison was made with the results obtained from commercial binary Ni-P (6~7 wt.% of P) metallization. The microstructure of the intermetallic compounds (IMCs) for Ni-P/Sn-3.5Ag and Ni-Sn-P/Sn-3.5Ag soldering reactions were investigated under different reflow durations with a reflow temperature of 260°C. The diffusion mechanisms of solder reaction for both types of solder joints were discussed. In addition, it was found that the formation of microvoids is much more difficult in Ni-Sn-P solder joints than that in Ni-P solder joints, indicating Ni-Sn-P solder joints will have better mechanical properties.
Keywords :
ball grid arrays; flip-chip devices; melting point; metallisation; nickel alloys; phosphorus alloys; reflow soldering; silver alloys; solders; tin alloys; BGA; Ni-Sn-P; SnAg; coating stress; diffusion process; flip chip technology; interfacial reaction; intermetallic compound microstructure; lead-free solders; mechanical property; melting points; microvoids; reflow study; reflow temperature; solder joints; soldering metallization; soldering reflow; temperature 260 degC;
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-8560-4
Electronic_ISBN :
978-1-4244-8561-1
DOI :
10.1109/EPTC.2010.5702739