Title :
Virtual prototyping advanced by statistic and stochastic methodologies
Author :
Rzepka, Sven ; Müller, Axel ; Michel, Bernd
Author_Institution :
Micro Mater. Center, Fraunhofer ENAS, Chemnitz, Germany
Abstract :
The paper reports three examples of best industrial practice showing the substantial benefits gained in terms of time-to-market reduction when virtual prototyping is enhanced by statistical and stochastic methodologies. These examples from a microelectronics setting of high volume component and module manufacturing deal with different fields: i) ball grid array (BGA) design optimization based on sophisticated design-of-experiments (DoE) and response surface (RS) schemes, ii) material modeling based on stochastic parameter identification and optimization, and iii) process pre-qualification by involving a stochastic robustness analysis.
Keywords :
ball grid arrays; design of experiments; optimisation; response surface methodology; statistical analysis; stochastic processes; time to market; virtual prototyping; BGA; DoE; ball grid array design optimization; design-of-experiments; high volume component; material modeling; microelectronics setting; module manufacturing; process prequalification; response surface schemes; statistic methodology; stochastic methodology; stochastic parameter identification; stochastic robustness analysis; time-to-market reduction; virtual prototyping; Design optimization; Electronics packaging; Manufacturing industries; Manufacturing processes; Microelectronics; Statistics; Stochastic processes; Time to market; Virtual manufacturing; Virtual prototyping;
Conference_Titel :
Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE), 2010 11th International Conference on
Conference_Location :
Bordeaux
Print_ISBN :
978-1-4244-7026-6
DOI :
10.1109/ESIME.2010.5464571