Title :
“REIS-IE” X-ray tester: description, qualification technique and results, dosimetry procedure
Author :
Artamonov, A.S. ; Chumakov, A.I. ; Eremin, N.V. ; Figurov, V.S. ; Kalashnikov, O.A. ; Nikiforov, A.Y. ; Sogojan, A.V.
Author_Institution :
Specialized Electron. Syst., Moscow, Russia
Abstract :
The original “REIS-IE” X-ray tester for IC total-dose radiation effects investigation is developed. The qualification technique is described and tests results are presented. The dosimetry procedure is validated in “REIS-IE” vs. Cobalt-60 comparative tests
Keywords :
X-ray apparatus; calibration; cobalt; dosimetry; integrated circuit testing; portable instruments; radiation hardening (electronics); test equipment; Co; Cobalt-60 comparative tests; IC total-dose radiation effects; X-ray tester; calibration; dosimetry; natural cooling; portable equipment; qualification; tests results; transmissible X-ray tube; Control systems; Cooling; Detectors; Dosimetry; Integrated circuit testing; Qualifications; Size control; System testing; Temperature control; Voltage control;
Conference_Titel :
Radiation Effects Data Workshop, 1998. IEEE
Conference_Location :
Newport Beach, CA
Print_ISBN :
0-7803-5109-6
DOI :
10.1109/REDW.1998.731498
