DocumentCode
2360330
Title
Radiation testing results of COTS based space microcircuits
Author
Layton, P. ; Anthony, H. ; Boss, R. ; Hsu, P.
Author_Institution
Space Electron. Inc., San Diego, CA, USA
fYear
1998
fDate
36000
Firstpage
170
Lastpage
176
Abstract
Single event effects and total ionizing dose data collected by SEi for Commercial-Off-The-Shelf (COTS) microcircuits are presented. The data was collected for evaluation of these devices for commercial space programs
Keywords
aerospace testing; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; COTS; SEi; Single event effects; commercial space programs; commercial-off-the-shelf microcircuits; radiation testing; space microcircuits; total ionizing dose; Electronic equipment testing; Integrated circuit modeling; Integrated circuit testing; Ionizing radiation; Performance evaluation; Production; Protection; Satellites; Single event upset; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1998. IEEE
Conference_Location
Newport Beach, CA
Print_ISBN
0-7803-5109-6
Type
conf
DOI
10.1109/REDW.1998.731499
Filename
731499
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