DocumentCode :
2360549
Title :
Seventh workshop on hot topics in system dependability (HotDep´11)
Author :
Haeberlen, Andreas ; Elnozahy, Mootaz
Author_Institution :
University of Pennsylvania
fYear :
2011
fDate :
27-30 June 2011
Firstpage :
164
Lastpage :
164
Abstract :
We are pleased to present to the community the proceedings of HotDep´11, the seventh instance of the HotDep workshop series. The goals of Hot-Dep are to bring forth cutting-edge research ideas spanning the various domains of dependable systems, and to build linkages between two communities with active interest in dependability research, namely researchers who attend traditional dependability conferences such as DSN and ISSRE, and those who attend mainstream systems conferences such as SOSP, OSDI, and EuroSys. To achieve these goals, the workshop has been alternating between a dependability conference in odd years and a systems conference in even years. This year, we have kept the tradition of previous meetings by selecting a program committee with a mix of researchers from both communities: • Lorenzo Alvisi, University of Texas at Austin • Remzi Arpaci-Dusseau, University of Wisconsin, Madison • Byung-Gon Chun, Intel Labs Berkeley • Arun Iyengar, IBM Research • Mohamed Kaâniche, LAAS-CNRS • Daniel Mossé, University of Pittsburgh • Priya Narasimhan, Intel Labs/Carnegie Mellon University • James Plank, University of Tennessee • André Schiper, EPFL • Alexander Shraer, Yahoo! Research • Atul Singh, NEC Labs, Princeton • Marco Vieira, University of Coimbra • Lidong Zhou, Microsoft Research Asia, Beijing
Keywords :
Asia; Communities; Conferences; Couplings; Fault tolerant systems; Intrusion detection; Software reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Systems and Networks Workshops (DSN-W), 2011 IEEE/IFIP 41st International Conference on
Conference_Location :
Hong Kong, China
Print_ISBN :
978-1-4577-0374-4
Electronic_ISBN :
978-1-4577-0373-7
Type :
conf
DOI :
10.1109/DSNW.2011.5958806
Filename :
5958806
Link To Document :
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