Title :
Compact Modeling of MOSFET with VHDL-AMS language
Author :
Coyitangiye, Lyse-Aline ; Grisel, Richard
Author_Institution :
UMR CNRS, Univ. de Rouen
Abstract :
The paper describes a MOSFET physical based model with the lumped-charge technique. For the correct description of the static and dynamic behavior the model is based on charge nodes that represent the active charges in the device. Models that are based on charge equations are simulated accurately when the conservation charge is guaranteed. The capacitances are described with the capacitance EKV model that is also based on charge equations. The modification caused to the threshold voltage due to non-uniform substrate doping is also presented. The model is developed and simulated thanks to VHDL-AMS language
Keywords :
MOSFET; hardware description languages; MOSFET compact modeling; VHDL-AMS language; analog-mixed signal language; lumped-charge technique; nonuniform substrate doping; static-dynamic behavior; Capacitance; Circuit simulation; Doping; Electric variables measurement; MOSFET circuits; Packaging; Poisson equations; Semiconductor process modeling; Solid modeling; Threshold voltage;
Conference_Titel :
IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on
Conference_Location :
Paris
Print_ISBN :
1-4244-0390-1
DOI :
10.1109/IECON.2006.347230