Title :
Measurement of latent charge image using Pockels effect
Author :
Akiyama, N. ; Zhu, Y.C. ; Kawasaki, T. ; Takada, T.
Author_Institution :
Musashi Inst. of Technol., Tokyo, Japan
Abstract :
Highly sensitive optical measurement technique to visualize and quantity a latent surface charge image on a dielectric material has been developed by using Pockels effect and a computer image technique. This system has several improved performance, e.g., the sensitivity of 1 nC cm-2 and the spatial resolution of 200 μm. In this paper, the basic measurement principle and the typical surface charge distribution of positive streamer produced by impulse high voltage (5 kV peak) are demonstrated
Keywords :
Pockels effect; electrets; surface charging; surface potential; Pockels effect; computer image technique; highly sensitive optical measurement technique; impulse high voltage; latent charge image; positive streamer; sensitivity; spatial resolution; surface charge distribution; Charge measurement; Current measurement; Dielectric materials; Dielectric measurements; Measurement techniques; Optical computing; Optical sensors; Spatial resolution; Streaming media; Visualization;
Conference_Titel :
Electrets, 1994. (ISE 8), 8th International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-7803-1940-0
DOI :
10.1109/ISE.1994.514775
