Measurement of latent charge image using Pockels effect

Author

Akiyama, N. ; Zhu, Y.C. ; Kawasaki, T. ; Takada, T.

Author_Institution

Musashi Inst. of Technol., Tokyo, Japan

fYear

1994

fDate

7-9 Sep 1994

Firstpage

242

Lastpage

247

Abstract

Highly sensitive optical measurement technique to visualize and quantity a latent surface charge image on a dielectric material has been developed by using Pockels effect and a computer image technique. This system has several improved performance, e.g., the sensitivity of 1 nC cm^-2 and the spatial resolution of 200 μm. In this paper, the basic measurement principle and the typical surface charge distribution of positive streamer produced by impulse high voltage (5 kV _peak) are demonstrated

Keywords

Pockels effect; electrets; surface charging; surface potential; Pockels effect; computer image technique; highly sensitive optical measurement technique; impulse high voltage; latent charge image; positive streamer; sensitivity; spatial resolution; surface charge distribution; Charge measurement; Current measurement; Dielectric materials; Dielectric measurements; Measurement techniques; Optical computing; Optical sensors; Spatial resolution; Streaming media; Visualization;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrets, 1994. (ISE 8), 8th International Symposium on

Conference_Location

Paris

Print_ISBN

0-7803-1940-0

Type

conf

DOI

10.1109/ISE.1994.514775

Filename

514775

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2361255