Title :
High field conduction and breakdown of ultra thin evaporated polypropylene films
Author :
Ochiai, S. ; Ogawa, T. ; Takagi, Toshiyuki ; Kojima, T.K. ; Ohashi, A. ; Ieda, Mirai ; Mizutani, T.
Author_Institution :
Dept. of Electr. Eng., Aichi Inst. of Technol., Toyota, Japan
Abstract :
The conduction current of an Al/thin PP film/Al structure are explained by tunneling injection and its breakdown strength was about 12 MV/cm without a self-healing breakdown. The surface structures of a conventional PP film and a thin PP film were measured with ESCA, and compared with each other. The degree of oxidation of the thin PP film surface was two times higher than that of a conventional PP film surface. X-ray diffraction studies showed that the thin PP film had high crystallinity and orientation
Keywords :
MIM structures; X-ray diffraction; X-ray photoelectron spectra; electric breakdown; electrical conductivity; high field effects; metal-insulator boundaries; organic insulating materials; oxidation; polymer films; surface structure; tunnelling; vacuum deposited coatings; Al; Al/thin PP film/Al structure; ESCA; X-ray diffraction; breakdown strength; conduction current; crystallinity; high field conduction; orientation; oxidation; self-healing breakdown; surface structures; tunneling injection; ultra thin evaporated polypropylene films; Artificial intelligence; Capacitance; Conductive films; Electric breakdown; Electrodes; Glass; Polymer films; Rough surfaces; Surface roughness; Thickness measurement;
Conference_Titel :
Electrets, 1994. (ISE 8), 8th International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-7803-1940-0
DOI :
10.1109/ISE.1994.514782
