Title : 
Polarization phenomena associated with the microstructure of PEEK
         
        
            Author : 
Mourgues, Magali ; Bernes, Alain ; Lacabanne, Colette
         
        
            Author_Institution : 
Lab. of Solid State Phys., Univ. Paul Sabatier, Toulouse, France
         
        
        
        
        
        
            Abstract : 
The microstructure of Poly (Ether Ether Ketone)/PEEK has been analysed by Thermo Stimulated Currents/TSC. The amorphous phase has been characterized by the kinetic of the molecular mobility involved in dielectric relaxation. Around the glass transition temperature, a complex TSC peak is observed: The lower temperature component, situated at 150°C, has been associated with cooperative movements in the “mobile amorphous phase” of PEEK. The higher temperature component, situated at 162°C, has been attributed to the existence of a “rigid amorphous phase” with local order induced by crystallites. The evolution of mechanical properties of PEEK upon crystallinity can be explained with the hypothesis of a three phase model: crystalline phase, mobile amorphous phase and rigid amorphous phase
         
        
            Keywords : 
crystal microstructure; dielectric relaxation; electrets; glass transition; organic insulating materials; polymer structure; polymers; thermally stimulated currents; 150 C; 162 C; PEEK microstructure; amorphous phase; complex TSC peak; crystallites; dielectric relaxation; glass transition temperature; local order; mechanical properties; mobile amorphous phase; molecular mobility; polarization phenomena; poly(ether ether ketone); rigid amorphous phase; three phase model; Amorphous materials; Crystal microstructure; Crystallization; Dielectrics; Electrochemical impedance spectroscopy; Glass; Physics; Polarization; Solid state circuits; Temperature;
         
        
        
        
            Conference_Titel : 
Electrets, 1994. (ISE 8), 8th International Symposium on
         
        
            Conference_Location : 
Paris
         
        
            Print_ISBN : 
0-7803-1940-0
         
        
        
            DOI : 
10.1109/ISE.1994.514793