Title :
Influence of noise in DC current measurements in the range of 0.1 nA – 1 mA
Author :
Katkov, A. ; Pavlov, O. ; Gerasimenko, V.
Author_Institution :
D.I. Mendeleyev Inst. for Metrol., St. Petersburg, Russia
Abstract :
This article describes theoretical and experimental studies of the noise influence in direct current measurements by means of measures of voltage and resistance, as well as by serial precision ammeters and DC current calibrators. It was shown that the shot noise restrict the measurement accuracy level of dc current in this measurement range.
Keywords :
ammeters; calibration; electric current measurement; electric noise measurement; electric resistance measurement; shot noise; voltage measurement; DC current calibrator; DC current measurement; current 0.1 nA to 1 mA; direct current measurement; resistance measurement; serial precision ammeter; shot noise; voltage measurement; Accuracy; Current measurement; Electrical resistance measurement; Noise; Noise measurement; Resistance; Voltage measurement; DC current measurement; noise; resistance reference; voltage reference;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898351
