Title : 
Comparison of Losses and Thermal Performance of a Three-Level Three-Phase Neutral-Point-Clamped dc-ac Converter under a Conventional NTV and the NTV2 Modulation Strategies
         
        
            Author : 
Busquets-Monge, Sergio ; Bordonau, Josep ; Beristain, Jose A.
         
        
            Author_Institution : 
Dept. of Electron. Eng., Catalonia Tech. Univ., Barcelona
         
        
        
        
        
        
            Abstract : 
Several pulsewidth modulation strategies have been proposed for the three-level three-phase neutral-point-clamped DC-AC converter. Among them, the nearest-three virtual-space-vector (NTV2 ) pulsewidth modulation (PWM) guarantees the DC-link capacitor voltage balance under any operating condition, provided that the addition of the three phase currents equals zero. However, this is achieved at the expense of a higher number of switching transitions per switching cycle, as compared to conventional nearest-three space vector (NTV) PWM. This paper presents a detailed loss and thermo-dynamical model of the converter. The model is used to quantitatively compare the converter losses and device thermal stress incurred by the NTV2 PWM and a conventional NTV PWM, operating at the same switching frequency, and for different AC load angles. The results show that under low load angles the NTV2 PWM presents a similar amount of losses and device junction temperature stress compared to the conventional NTV PWM, thanks to a better switch utilization
         
        
            Keywords : 
DC-AC power convertors; PWM power convertors; power capacitors; switching convertors; thermodynamics; DC-link capacitor voltage balance; converter thermodynamical model; nearest-three virtual-space-vector PWM; pulsewidth modulation strategies; switching frequency; three-level three-phase neutral-point-clamped DC-AC converter; Capacitors; Performance loss; Phase modulation; Pulse width modulation; Pulse width modulation converters; Space vector pulse width modulation; Switches; Switching converters; Thermal stresses; Voltage;
         
        
        
        
            Conference_Titel : 
IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on
         
        
            Conference_Location : 
Paris
         
        
        
            Print_ISBN : 
1-4244-0390-1
         
        
        
            DOI : 
10.1109/IECON.2006.347400