Title : 
Lower bounds and bit error outage of the linear SFBC combiner in an LTE system with imperfect channel state information
         
        
            Author : 
Horvat, Michael ; BAI, Zijian ; BRUCK, Guido H. ; Jung, Peter
         
        
            Author_Institution : 
Infineon Technol. AG, Neubiberg, Germany
         
        
        
        
        
        
            Abstract : 
In this work a space-frequency block coding (SFBC) system is considered, which is compliant to the Long-Term-Evolution (LTE) specification. The Cramer-Rao bound (CRB) for the mimimum mean-square error (MMSE) of the channel estimator for an SFBC receiver is calculated comparing optimum versus robust Wiener interpolation. Further a lower bound on the bit error ratio (BER) of a binary phase-shift keying (BPSK) modulated SFBC system with imperfect channel state information (CSI) is derived. Finally the bit error outage (BEO) of the linear Alamouti combiner in presence of log-normal fading signal-to-noise ratio (SNR) is compared for different power delay profiles (PDP).
         
        
            Keywords : 
Long Term Evolution; block codes; channel estimation; error statistics; fading channels; interpolation; log normal distribution; mean square error methods; phase shift keying; radio receivers; stochastic processes; BEO; BER; BPSK modulated SFBC system; CRB; CSI; Cramer-Rao bound; LTE specification; LTE system; MMSE; PDP; SFBC receiver; SNR; Wiener interpolation; binary phase-shift keying; bit error outage; bit error ratio; channel estimator; imperfect channel state information; linear Alamouti combiner; linear SFBC combiner; log-normal fading signal-to-noise ratio; long-term-evolution specification; mimimum mean-square error; power delay profiles; space-frequency block coding system;
         
        
        
        
            Conference_Titel : 
Applied Sciences in Biomedical and Communication Technologies (ISABEL), 2010 3rd International Symposium on
         
        
            Conference_Location : 
Rome
         
        
            Print_ISBN : 
978-1-4244-8131-6
         
        
        
            DOI : 
10.1109/ISABEL.2010.5702839