DocumentCode
2362099
Title
Fe/Ge catalyzed carbon nanotube growth on HfO2 for nano-sensor applications
Author
Uchino, T. ; Ayre, G.N. ; Smith, D.C. ; Hutchison, J.L. ; de Groot, C.H. ; Ashburn, P.
Author_Institution
Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK
fYear
2009
fDate
14-18 Sept. 2009
Firstpage
197
Lastpage
200
Abstract
A carbon nanotube (CNT) growth process on HfO2 is reported for the first time for application in nano-sensors. The process uses a combination of Ge nanoparticles and ferric nitrate dispersion and achieves an increase in CNT density from 0.15 to 6.2 mum length/mum2 compared with the use of ferric nitrate dispersion alone. The growth process is validated by the fabrication of back-gate CNT field-effect transistors (CNTFETs) using Al source/drain (S/D) contacts and a H2 anneal at 400degC. The transistors exhibit p-FET behavior with an Ion/Ioff ratio of 105 and a steep sub-threshold slope of 130 mV/dec. These results are rather surprising, as earlier research in the literature on CNTFETs with Al S/D electrodes showed n-FET behavior. The p-FET behavior is shown to be due to the H2 anneal, which we ascribe to the smaller electron affinity of hydrogenised CNTs. Measurements of the temperature dependence of the drain current show low Schottky barrier height Al S/D contacts after a H2 anneal, which tends to confirm this explanation.
Keywords
Schottky barriers; annealing; carbon nanotubes; catalysis; electron affinity; field effect transistors; hafnium compounds; nanoelectronics; nanoparticles; nanosensors; nanotube devices; C; CNTFET fabrication process; Fe-Ge; HfO2; Schottky barrier; annealing; back-gate CNT field-effect transistor; carbon nanotube growth; catalysis; drain current; electron affinity; ferric nitrate dispersion; nanoparticles; nanosensor; p-FET; temperature 400 C; temperature dependence; Annealing; Carbon nanotubes; Current measurement; Electrodes; Electrons; FETs; Fabrication; Hafnium oxide; Iron; Nanoparticles;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 2009. ESSDERC '09. Proceedings of the European
Conference_Location
Athens
ISSN
1930-8876
Print_ISBN
978-1-4244-4351-2
Electronic_ISBN
1930-8876
Type
conf
DOI
10.1109/ESSDERC.2009.5331539
Filename
5331539
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