DocumentCode :
236211
Title :
Development of high accuracy standard capacitance box
Author :
Dongxue Dai ; Xiaobing He ; Pan Jin ; Wei Wang
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
fYear :
2014
fDate :
24-29 Aug. 2014
Firstpage :
280
Lastpage :
281
Abstract :
This paper describes the dielectric material and the structure of the standard capacitance box (decade capacitor) developed by NIM with the capacitance range of 1pF to 0.1μF and the accuracy of 50ppm at 1 kHz. High stability and high accuracy of the standard capacitance box mainly derives from a choice of dielectric materials that are fused-silica and nano-ceramic, and each capacitor in the box contained a constant temperature control system. Special decade switch with the three-terminal full shield structure can eliminate the capacitance variance caused by the stray capacitance so that higher accuracy and lower zero capacitance can be achieved.
Keywords :
capacitance measurement; capacitors; ceramics; circuit stability; dielectric materials; measurement standards; nanostructured materials; temperature control; NIM; capacitance 1 pF to 0.1 muF; constant temperature control system; decade capacitor; dielectric material; frequency 1 kHz; fused-silica material; nanoceramic material; stability; standard capacitance box structure; stray capacitance; three-terminal full shield structure; Accuracy; Capacitance; Capacitors; Dielectric materials; Standards; Switches; Temperature control; Measurement; constant temperature; control system; fused-silica; nano-ceramic; special decade switch; standard capacitance box;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
ISSN :
0589-1485
Print_ISBN :
978-1-4799-5205-2
Type :
conf
DOI :
10.1109/CPEM.2014.6898368
Filename :
6898368
Link To Document :
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