The EMRP project Metrology for III–V materials based high efficiency multi-junction solar cells

Author

Bounouh, A. ; Almuneau, G. ; Baumgartner, H. ; Cuenat, A. ; Gambacorti, N. ; Hoffmann, J. ; Kern, R. ; Kienberger, F. ; Krupka, Jerzy ; Lackner, David ; Pollakowski, B. ; Rodriguez, T.G. ; Sametoglu, F. ; Usydus, L. ; Winter, Stefan ; Witt, F.

Author_Institution

Lab. Nat. de Metrol. et d´Essais, Paris, France

fYear

2014

fDate

24-29 Aug. 2014

Firstpage

318

Lastpage

319

Abstract

End of 2013 EURAMET, the European metrology organization opened a call to advance measurement science and technology in the field of Energy by providing funding for Joint Research Projects (JRP) to be funded jointly by the European Commission and the participating countries in the frame of the European Metrology Research Programme (EMRP). This paper describes a planned project; no technical results will be available at the time of the conference. We feel, however, that CPEM is a suitable platform to discuss our plans.

Keywords

III-V semiconductors; solar cells; EMRP project metrology; III-V materials; high efficiency multijunction solar cells; Europe; Materials; Metrology; Photovoltaic cells; Semiconductor device measurement; Solar energy; Standards; III–V materials characterization; Multijunction solar cells standards; Nanoscale electrical measurement; high conversion efficiency;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on

Conference_Location

Rio de Janeiro

ISSN

0589-1485

Print_ISBN

978-1-4799-5205-2

Type

conf

DOI

10.1109/CPEM.2014.6898387

Filename

6898387