Title :
The influence of different electrode geometries on the current density distribution during radio-frequency ablation. A three-dimensional finite element study
Author :
Panescu, Dorin ; Fleishman, Sidney D. ; Whayne, James G. ; Swanson, David K. ; Webster, John G.
Author_Institution :
EP Technol. Inc., Sunnyvale, CA, USA
Abstract :
The locations of current density maxima can provide information about the locations of temperature maxima. Our goals were: (1) to find the optimal place of the temperature sensor used for temperature-controlled ablation; (2) to assess at which locations char is more likely to occur. Using finite element modeling, we analyzed the current density distribution for a 8Fr/5 mm straight and a 8Fr/8 mm valve ablation electrodes. The maximal current densities occurred at the tip of the electrodes. Hence, it is best to place the temperature sensor, which provides input for the temperature control, at the electrode tip. Also, the analysis showed that using an electrically insulating coating layer at the junction between the electrode and the catheter body significantly reduced the local current density, therefore the local temperature. This avoids the formation of charring
Keywords :
bioelectric phenomena; biological effects of radiation; current density; finite element analysis; hyperthermia; radiation therapy; temperature sensors; 5 mm; 8 mm; catheter body; char; charring; current density distribution; electrically insulating coating layer; electrode geometries; electrode tip; local temperature; radiofrequency ablation; temperature control; temperature maxima; temperature sensor; temperature-controlled ablation; three-dimensional finite element study; valve ablation electrodes; Catheters; Coatings; Current density; Dielectrics and electrical insulation; Electrodes; Finite element methods; Geometry; Temperature control; Temperature sensors; Valves;
Conference_Titel :
Engineering in Medicine and Biology Society, 1994. Engineering Advances: New Opportunities for Biomedical Engineers. Proceedings of the 16th Annual International Conference of the IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-2050-6
DOI :
10.1109/IEMBS.1994.415293