Metrology method for EVM based on waveform design

In this paper, we mainly focus on the metrological issues of such error parameters as EVM (Error Vector Magnitude), and address technical solutions on: 1. periodical continuity of digital modulated baseband waveforms with finite length; 2. fundamental digital modulation error settings based on error symbol design. This system can be applied to calibrate VSA (vector signal analyzer), and simulations have shown that it can continuously adjust the values of digital modulation errors in a large range, and set the expected error parameters. In addition, it also shows strong consistency of the measured value and the calculated values for EVM.