DocumentCode :
2362792
Title :
Opportunistic multimodel-based diagnosis: Framing all the knowledge we have to diagnose complex artifacts
Author :
Bonarini, Andrea ; Sassaroli, Piera
Author_Institution :
Dipartimento di Elettronica, Politecnico di Milano, Italy
fYear :
1993
fDate :
1-5 Mar 1993
Firstpage :
429
Lastpage :
436
Abstract :
Presents OMISSYS (Opportunistic Multimodel-based diagnosIS SYStem), an approach to diagnosis where all the available knowledge is framed into different types of models, belonging to a space defined by: level of abstraction, uncertainty, and epistemological type. All the knowledge is represented using possibly qualitative relationships among variables and possibly approximated values. OMISSYS uses the so-framed incomplete, uncertain, and approximate knowledge to diagnose a complex artifact, such as an industrial plant. It navigates opportunistically through an arbitrary set of models to reach a predefined diagnosis goal
Keywords :
diagnostic expert systems; diagnostic reasoning; frame based representation; model-based reasoning; uncertainty handling; OMISSYS; abstraction level; approximated values; complex artifacts diagnosis; diagnosis goal; epistemological type; incomplete knowledge; industrial plant; knowledge framing; knowledge representation; models; opportunistic multimodel-based diagnosis; qualitative relationships; uncertainty; Computational complexity; Diagnostic expert systems; Fault diagnosis; Industrial plants; Industrial relations; Knowledge acquisition; Navigation; Observability; System testing; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Artificial Intelligence for Applications, 1993. Proceedings., Ninth Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-8186-3840-0
Type :
conf
DOI :
10.1109/CAIA.1993.366635
Filename :
366635
Link To Document :
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